Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

著者

• IEEE International Workshop on Memory Testing
• Rajsuman, Rochit
• Rajkanan, K. (Kamal)
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Council

書誌事項

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council

IEEE Computer Society Press, c1995

タイトル別名

95TH8065

注記

"IEEE catalog number 95TH8065"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA28718416
• ISBN:
  • 0818671025
• LCCN: 95075673
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 129 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.M4
  • DC20 : 621.39/732
• 件名:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses