Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

Author(s)

• IEEE International Workshop on Memory Testing
• Rajsuman, Rochit
• Rajkanan, K. (Kamal)
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Council

Bibliographic Information

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council

IEEE Computer Society Press, c1995

Other Title

95TH8065

Note

"IEEE catalog number 95TH8065"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA28718416
• ISBN:
  • 0818671025
• LCCN: 95075673
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 129 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.M4
  • DC20 : 621.39/732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses