Proceedings of the Fourth Asian Test Symposium, November 23-24, 1995, Bangalore, India

著者

• Asian Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• VLSI Society of India

書誌事項

Proceedings of the Fourth Asian Test Symposium, November 23-24, 1995, Bangalore, India

sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI)

IEEE Computer Society Press, c1995

タイトル別名

95CS8084

注記

"IEEE order plan catalog number 95CS8084"

Includes bibliographies and index

• NII書誌ID(NCID): BA28737432
• ISBN:
  • 0818671297
• LCCN: 95076727
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA
• ページ数/冊数: xiv, 394 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/548
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses