Proceedings of the Fourth Asian Test Symposium, November 23-24, 1995, Bangalore, India

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• VLSI Society of India

Bibliographic Information

Proceedings of the Fourth Asian Test Symposium, November 23-24, 1995, Bangalore, India

sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI)

IEEE Computer Society Press, c1995

Other Title

95CS8084

Note

"IEEE order plan catalog number 95CS8084"

Includes bibliographies and index

Details

• NCID: BA28737432
• ISBN:
  • 0818671297
• LCCN: 95076727
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, CA
• Pages/Volumes: xiv, 394 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/548
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses