Proceedings, 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Proceedings, 14th IEEE VLSI Test Symposium : April 28-May 1, 1996, Princeton, New Jersey

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press, c1996

タイトル別名

96TB100043

注記

Includes bibliographical references and index

"IEEE order plan number 96TB100043"--T.p. verso

• NII書誌ID(NCID): BA28783564
• ISBN:
  • 0818673044
• LCCN: 96075502
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxix, 510 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses