Proceedings : International Test Conference 1996

著者

• International Test Conference
• IEEE Computer Society

書誌事項

Proceedings : International Test Conference 1996

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference, c1996

• : soft
• : case
• :microfiche
• :CD-ROM

タイトル別名

ITC : International Test Conference 1996

1996 IEEE International Test Conference

Test and design validity

96CH35976

注記

"October 20-25, 1996, Sheraton Washington Hotel, Washington, D.C. USA"--Cover

"IEEE Catalog Number 96CH35976."--T.p. verso

Includes bibliographies and index

内容説明・目次

内容説明

ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.

「Nielsen BookData」 より

• NII書誌ID(NCID): BA29518944
• ISBN:
  • 0780335406
  • 0780335414
  • 0780335422
  • 0780335430
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Altoona, PA
• ページ数/冊数: xii, 951 p.
• 大きさ: 29 cm
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses