Transmission electron microscopy : physics of image formation and microanalysis
著者
書誌事項
Transmission electron microscopy : physics of image formation and microanalysis
（Springer series in optical sciences, v. 36）
Springer, c1997
4th ed
大学図書館所蔵 件 / 全28件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references (p.[495]-569) and index
内容説明・目次
内容説明
This text presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.
目次
- Particle optics of electrons
- wave optics of electrons
- elements of a transmission electron microscope
- electron-specimen interactions
- scattering and phase contrast for amorphous specimens
- theory of electron diffraction
- electron diffraction modes and applications
- imaging of crystalline specimens and their defects
- elemental analysis by X-Ray and electron energy-loss spectroscopy
- specimen damage by electron irradiation.
「Nielsen BookData」 より