Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society Press, c1997

• : pbk

タイトル別名

VTS '97

注記

"Sponsered by IEEE Computer Society Technical Committee on Test Technology ..."--Cover

Includes bibliographical references and index

"IEEE Computer Society Press order number PR07810"--T.p. verso

"IEEE order plan catalog number 97TB100125"--Back cover

詳細情報

• NII書誌ID(NCID): BA33983755
• ISBN:
  • 0818678100
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxxii, 466 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses