Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

Author(s)

• IEEE International Workshop on Memory Testing
• Rajsuman, Rochit
• Swee, Yong-Khim
• Lau, Lee-Yee
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Council

Bibliographic Information

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press, c1996

Other Title

96TB100042

Note

"IEEE catalog number 96TB100042"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA35193367
• ISBN:
  • 0818674660
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 117 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.M4
  • DC20 : 621.39/732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses