Scanning electron microscopy : physics of image formation and microanalysis

Author(s)

• Reimer, Ludwig

Bibliographic Information

Scanning electron microscopy : physics of image formation and microanalysis

Ludwig Reimer

（Springer series in optical sciences, v. 45）

Springer, c1998

2nd completely revised and updated ed

• : hardcover

Note

Includes bibliographical references and index

Details

• NCID: BA37992011
• ISBN:
  • 3540639764
• LCCN: 98026178
• Country Code: gw
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Berlin ; Tokyo
• Pages/Volumes: xiv, 527 p.
• Size: 25 cm
• Classification:
  • LCC : QH212.S3
  • DC21 : 502/.8/25
• Subject Headings:
  • LCSH : Scanning electron microscopy
• Parent Bibliography ID:
  • BA00063354