Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.

著者

• IEEE International Workshop on IDDQ Testing
• Tong, Carol
• Jayasumana, Anura P.
• IEEE Computer Society. Technical Committee on Test Technology

書誌事項

Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.

edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press, c1996

タイトル別名

1996 IEEE International Workshop on IDDQ Testing

IEEE International Workshop on IDDQ Testing

IDDQ 96

96TB100067

注記

"IEEE Computer Society Press order number PR07655"--T.p. verso

"IEEE order plan catalog number 96TB100067"--T.p. verso

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA42650538
• ISBN:
  • 0818676558
• LCCN: 96077320
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 105 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871.99.M44
  • DC21 : 621.39/732
• 件名:
  • LCSH : Iddq testing -- Congresses
  • LCSH : Metal oxide semiconductors, Complementary -- Testing -- Congresses