Proceedings of the Fifth Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan

著者

• Asian Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology
• Kuo li chʿing hua ta hsüeh (Hsin-chu shih, Taiwan)

書誌事項

Proceedings of the Fifth Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan

sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua University

IEEE Computer Society Press, c1996

タイトル別名

96TB100072

注記

"IEEE order plan catalog number 96TB100072"

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA42663868
• ISBN:
  • 0818674792
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA
• ページ数/冊数: xviii, 306 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/548
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses