Proceedings : International Workshop on Memory Technology, Design, and Testing

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• Lombardi, Fabrizio
• Rajsuman, Rochit
• Wik, Thomas
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI

Bibliographic Information

Proceedings : International Workshop on Memory Technology, Design, and Testing

edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press, c1997

Other Title

97TB100159

Memory Technology, Design and Testing

MTDT'97

Note

"August 11-12, 1997, San Jose, California"--Cover

"IEEE Order Plan Catalog Number 97TB100159"--T.p. verso

"IEEE Computer Society Order Number PR08099"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA43222846
• ISBN:
  • 0818680997
• LCCN: 97202128
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 103 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.M4
  • DC21 : 621.39/732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses