Proceedings : International Workshop on Memory Technology, Design, and Testing

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Lombardi, Fabrizio
• Rajsuman, Rochit
• Wik, Thomas
• IEEE Computer Society. Test Technology Technical Committee
• IEEE Computer Society. Technical Committee on VLSI

書誌事項

Proceedings : International Workshop on Memory Technology, Design, and Testing

edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press, c1997

タイトル別名

97TB100159

Memory Technology, Design and Testing

MTDT'97

注記

"August 11-12, 1997, San Jose, California"--Cover

"IEEE Order Plan Catalog Number 97TB100159"--T.p. verso

"IEEE Computer Society Order Number PR08099"--T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

This text on computer hardware, design and technology should appeal to computing professionals and students.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA43222846
• ISBN:
  • 0818680997
• LCCN: 97202128
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: ix, 103 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.M4
  • DC21 : 621.39/732
• 件名:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses