Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Technical Committee on Test Technology

Bibliographic Information

Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan

sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press, c1997

Other Title

97TB100205

Note

"IEEE order plan catalog number 97TB100205"

Includes bibliographies and index

Details

• NCID: BA43673663
• ISBN:
  • 0818682094
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Ca.
• Pages/Volumes: xv, 418 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/548
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses