Proceedings : Seventh Asian Test Symposium (ATS '98), December 2-4, 1998, Singapore

Author(s)

• Asian Test Symposium
• IEEE Singapore Section. Computer Chapter
• IEEE Computer Society. Technical Committee on Test Technology

Bibliographic Information

Proceedings : Seventh Asian Test Symposium (ATS '98), December 2-4, 1998, Singapore

sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University

IEEE Computer Society Press, c1998

Other Title

98TB100259

Note

"IEEE order plan catalog number 98TB100259"

Includes bibliographies and index

Details

• NCID: BA43822741
• ISBN:
  • 0818682779
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Ca.
• Pages/Volumes: xviii, 528 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/548
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses