Proceedings : Seventh Asian Test Symposium (ATS '98), December 2-4, 1998, Singapore

著者

• Asian Test Symposium
• IEEE Singapore Section. Computer Chapter
• IEEE Computer Society. Technical Committee on Test Technology

書誌事項

Proceedings : Seventh Asian Test Symposium (ATS '98), December 2-4, 1998, Singapore

sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University

IEEE Computer Society Press, c1998

タイトル別名

98TB100259

注記

"IEEE order plan catalog number 98TB100259"

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA43822741
• ISBN:
  • 0818682779
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Ca.
• ページ数/冊数: xviii, 528 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/548
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses