1998 3rd International Workshop on Statistical Metrology, June 7, 1998, Honolulu

著者

• International Workshop on Statistical Metrology
• IEEE Electron Devices Society

書誌事項

1998 3rd International Workshop on Statistical Metrology, June 7, 1998, Honolulu

IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c1998

• :softbound
• :microfiche

タイトル別名

98EX113

注記

"IEEE cat. no. 98EX113."

Includes bibliographical references

sponsored by the IEEE EDS Society and the 1998 Symposium on VLSI Technology

詳細情報

• NII書誌ID(NCID): BA46671201
• ISBN:
  • 0780343387
  • 0780343395
• LCCN: 97080378
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [New York]
• ページ数/冊数: vi, 121 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871.85
• 件名:
  • LCSH : Semiconductors -- Characterization -- Statistical methods -- Congresses
  • LCSH : Semiconductors -- Measurement -- Congresses