Proceedings : 18th IEEE VLSI Test Symposium, 30 April-4 May, 2000, Montréal, Québec, Canada

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings : 18th IEEE VLSI Test Symposium, 30 April-4 May, 2000, Montréal, Québec, Canada

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2000

タイトル別名

18th IEEE VLSI Test Symposium

VTS00

PR00613

注記

Includes bibliographical references and index

IEEE Computer Society order number: PR00613

内容説明・目次

内容説明

These papers constitute the proceedings of the IEEE VLSI Test Symposium 2000. Subjects covered include: microprocessor test/validation; low power BIST and scan; defect driven techniques; analogue test techniques; temperature and process drift issues; and more.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA47892680
• ISBN:
  • 0769506135
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif. ; Tokyo
• ページ数/冊数: xxxix, 478 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses