Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Author(s)

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Chim, Wai Kin
• Radhakrishnan, M. K.
• Thong, John T. L.
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• Institute of Microelectronics

Bibliographic Information

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore

Institute of Electrical and Electronics Engineers, c1999

• :softbound

Other Title

99TH8394

7th International Symposium on th Physical & Failure Analysis of Integrated Circuits 1999

IPFA '99

Note

"IEEE catalog number 99TH8394"--T.p. verso

"5-9 July, 1999, Orchard Hotel, Singapore"--Cover

Includes bibliographical references and index

Details

• NCID: BA48948612
• ISBN:
  • 0780351878
• LCCN: 98088539
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: 209 p.
• Size: 30 cm