Noise in Semiconductor Devices : Modeling and Simulation

Author(s)

    • Fabrizio Bonani
    • Giovanni Ghione

Bibliographic Information

Noise in Semiconductor Devices : Modeling and Simulation

Fabrizio Bonani, Giovanni Ghione

(Advanced microelectronics, 7)

Springer, c2001

Available at  / 16 libraries

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Note

Includes bibliographical references and index

Description and Table of Contents

Description

Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.

Table of Contents

1. Noise in Semiconductor Devices.- 2. Noise Analysis Techniques.- 3. Physics-Based Small-Signal Noise Simulation.- 4. Results and Case Studies.- 5. Noise in Large-Signal Operation.- A. Appendix: Review of Probability Theory and Random Processes.- A.1 Fundamentals of Probability Theory.- A.2 Random Processes.- A.3 Correlation Spectra and Generalized Harmonic Analysis of Stochastic Processes.- A.4 Linear Transformations of Stochastic Processes.- A.5 Cyclostationary Stochastic Processes.- A.6 A Glimpse of Markov Stochastic Processes.- References.

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Details

  • NCID
    BA53208411
  • ISBN
    • 3540665838
  • Country Code
    gw
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Berlin ; Tokyo
  • Pages/Volumes
    xxxi, 213 p.
  • Size
    25 cm
  • Parent Bibliography ID
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