Noise in Semiconductor Devices : Modeling and Simulation

著者

    • Fabrizio Bonani
    • Giovanni Ghione

書誌事項

Noise in Semiconductor Devices : Modeling and Simulation

Fabrizio Bonani, Giovanni Ghione

(Advanced microelectronics, 7)

Springer, c2001

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.

目次

1. Noise in Semiconductor Devices.- 2. Noise Analysis Techniques.- 3. Physics-Based Small-Signal Noise Simulation.- 4. Results and Case Studies.- 5. Noise in Large-Signal Operation.- A. Appendix: Review of Probability Theory and Random Processes.- A.1 Fundamentals of Probability Theory.- A.2 Random Processes.- A.3 Correlation Spectra and Generalized Harmonic Analysis of Stochastic Processes.- A.4 Linear Transformations of Stochastic Processes.- A.5 Cyclostationary Stochastic Processes.- A.6 A Glimpse of Markov Stochastic Processes.- References.

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詳細情報

  • NII書誌ID(NCID)
    BA53208411
  • ISBN
    • 3540665838
  • 出版国コード
    gw
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Berlin ; Tokyo
  • ページ数/冊数
    xxxi, 213 p.
  • 大きさ
    25 cm
  • 親書誌ID
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