A designer's guide to built-in self-test
著者
書誌事項
A designer's guide to built-in self-test
（Frontiers in electronic testing）
Kluwer Academic, c2002
- : softcover
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注記
Includes bibliographical references and index
Softcover reprint of the hardcover 1st edition 2002, by Springer science+Business media (New York)
内容説明・目次
内容説明
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
目次
Preface. About the Author. 1. An Overview of BIST. 2. Fault Models, Detection, and Simulation. 3. Design for Testability. 4. Test Pattern Generation. 5. Output Response Analysis. 6. Manufacturing and System-Level Use of BIST. 7. Built-In Logic Block Observer. 8. Pseudo-Exhaustive BIST. 9. Circular BIST. 10. Scan-Based BIST. 11. Non-Intrusive BIST. 12. BIST for Regular Structures. 13. BIST for FPGAs and CPLDs. 14. Applying Digital BIST of Mixed-Signal Systems. 15. Merging BIST and Concurrent Fault Detection. Acronyms. Bibliography. Index.
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