High performance memory testing : design principles, fault modeling, and self-test

Author(s)

• Adams, R. Dean

Bibliographic Information

High performance memory testing : design principles, fault modeling, and self-test

R. Dean Adams

（Frontiers in electronic testing）

Kluwer Academic, c2003

Note

Includes bibliographical references and index

• NCID: BA6145707X
• ISBN:
  • 1402072554
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston ; London
• Pages/Volumes: xiii, 246 p.
• Size: 25 cm
• Classification:
  • DC21 : 621.39732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing
  • LCSH : Computer storage devices -- Testing
• Parent Bibliography ID:
  • BA19587827