High performance memory testing : design principles, fault modeling, and self-test

Author(s)

    • Adams, R. Dean

Bibliographic Information

High performance memory testing : design principles, fault modeling, and self-test

R. Dean Adams

(Frontiers in electronic testing)

Kluwer Academic, c2003

Available at  / 8 libraries

Search this Book/Journal

Note

Includes bibliographical references and index

Related Books: 1-1 of 1

Details

Page Top