Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics
Author(s)
Bibliographic Information
Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics
（Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 205）
Springer, c2004
Available at / 13 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
420.8:S1:2057210226358
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Hokkaido University, Library, Graduate School of Science, Faculty of Science and School of Science図書
DC22:530.8/P8642080007431
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.
The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Table of Contents
Introduction.- Methods for Meso-scale Structural Characterization.- Geometric Principles.- GRAINDEX and Related Analysis.- Orientation Mapping.- Combining 3DXRD and Absorption Contrast Tomography.- Multi-grain Crystallography.- The 3DXRD Microscope.- Applications.- Alternative Approaches.- Concluding Remarks.
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