Fault diagnosis of analog integrated circuits
Author(s)
Bibliographic Information
Fault diagnosis of analog integrated circuits
（Frontiers in electronic testing, 30）
Springer, c2005
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.
Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .
Also contains problems that can be used as quiz or homework.
Table of Contents
Fault and Fault Modelling.- Test Stimulus Generation.- Fault Diagnosis Methodology.- Design for Testability and Built-In Self-Test.
by "Nielsen BookData"