Silicon-based millimeter-wave technology : measurement, modeling and applications

著者

• Deen, M. Jamal

書誌事項

Silicon-based millimeter-wave technology : measurement, modeling and applications

guest editor, M. Jamal Deen

（Advances in imaging and electron physics / edited by Peter W. Hawkes, v. 174）

Academic Press, 2012

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

目次

Measurement Techniques and Practical Issues Jamal Deen Transmission lines and passive components Guennadi A. Kouzaev Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping Mohamed Bakr Field-effect types of transistors Benjamin Iniguez RF MEMS Switches and Switch Matrices Mojgan Daneshmand Substrate-Integrated Antennas on Silicon Natalia K. Nikolova

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BB11046467
• ISBN:
  • 9780123942982
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam
• ページ数/冊数: xix, 483 p., [15] p. of plates
• 大きさ: 24 cm
• 分類:
  • DC23 : 621.384
• 件名:
  • LCSH : Millimeter wave communication systems
• 親書誌ID:
  • BA24211536