Applied logistic regression

Author(s)

• Hosmer, David W.
• Lemeshow, Stanley
• Sturdivant, Rodney X.

Bibliographic Information

Applied logistic regression

David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant

（Wiley series in probability and mathematical statistics）

Wiley, c2013

3rd ed

• : [hardcover]

Note

Series statement on cover: Wiley series in probability and statistics

Includes bibliographical references (p. 459-478) and index

Details

• NCID: BB12413927
• ISBN:
  • 9780470582473
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Hoboken, N.J.
• Pages/Volumes: xvi, 500 p.
• Size: 25 cm
• Classification:
  • DC23 : 519.536
• Subject Headings:
  • LCSH : Regression analysis
• Parent Bibliography ID:
  • BA00019013