Advanced transmission electron microscopy : imaging and diffraction in nanoscience
著者
書誌事項
Advanced transmission electron microscopy : imaging and diffraction in nanoscience
Springer, c2017
- : [hardcover]
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注記
Includes bibliographical references (p. 644-652) and indexes
内容説明・目次
内容説明
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
目次
Introduction and historical background.- Electron Waves and Wave Propagation.- The geometry of electron diffraction patterns.- Kinematical Theory of Electron Diffraction.- Dynamical Theory of Electron Diffraction for Perfect Crystals.- Electron optics.- Lens aberrations and Aberration Correction.- Electron Sources.- Electron Detectors.- Instrumentation and experimental techniques.- Crystal symmetry.- Crystal structure and bonding.- Diffuse Scattering.- Atomic resolution electron imaging.- Imaging and characterization of crystal defects.- Strain Measurements and Mapping.- Structure of Nanocrystals, Nanoparticles and Nanotubes.
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