Kolbesen, Bernd O.

ID:DA07746930

別名: Kolbesen, B. (Bernd)

同姓同名の著者を検索

検索結果7件中 1-7 を表示

1

Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France

editors, Bernd O. Kolbesen ... [et al.] ; sponsoring division, Electronics and Photonics

Electrochemical Society c2005 Proceedings / [Electrochemical Society] v. 2005-10

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2

Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah

editors, Bernd O. Kolbesen ... [et al.] ; sponsored by the Electrochemical Society. Electronics Division

Electrochemical Society c2003 Proceedings / [Electrochemical Society] v. 2003-3

SPIE

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3

Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany

editors, B.O. Kolbesen ... [et al.]

Electrochemical Society c2001 Proceedings / [Electrochemical Society] v. 2001-29

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4

Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division

Electrochemical Society c1999 Proceedings / [Electrochemical Society] v. 99-16 , Proceedings / SPIE -- the International Society for Optical Engineering v. 3895

:ECS , :SPIE

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5

Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II

editors, Bernd O. Kolbesen ... [et al.] ; Electronics Division [of the Electrochemical Society]

Electrochemical Society c1997 Proceedings / [Electrochemical Society] v. 97-22

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6

ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands

edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ; [sponsored by] Electronics Division

Electrochemical Society c1995 Proceedings / [Electrochemical Society] v. 95-30

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7

Proceedings of the Satellite Symposium to ESSDERC 93 Grenoble/France : crystalline defects and contamination: their impact and control in device manufacturing

edited by B.O. Kolbesen ... [et al.] ; [sponsored by the] Electronics Division

Electrochemical Society c1993 Proceedings / [Electrochemical Society] v. 93-15

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