New horizons in testing : latent trait test theory and computerized adaptive testing

著者

• Weiss, David J.
• Bock, R. Darrell
• Computerized Adaptive Testing Conference
• United States. Office of Naval Research

書誌事項

New horizons in testing : latent trait test theory and computerized adaptive testing

edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.]

Academic Press, 1983

注記

Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al

Includes bibliographies and indexes

詳細情報

• NII書誌ID(NCID): BA00680204
• ISBN:
  • 0127427805
• LCCN: 82024374
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xvii, 345 p.
• 大きさ: 24 cm
• 分類:
  • LCC : BF176
  • DC19 : 153.9/3
• 件名:
  • LCSH : Psychological tests -- Congresses