New horizons in testing : latent trait test theory and computerized adaptive testing

Author(s)

• Weiss, David J.
• Bock, R. Darrell
• Computerized Adaptive Testing Conference
• United States. Office of Naval Research

Bibliographic Information

New horizons in testing : latent trait test theory and computerized adaptive testing

edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.]

Academic Press, 1983

Note

Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al

Includes bibliographies and indexes

Details

• NCID: BA00680204
• ISBN:
  • 0127427805
• LCCN: 82024374
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xvii, 345 p.
• Size: 24 cm
• Classification:
  • LCC : BF176
  • DC19 : 153.9/3
• Subject Headings:
  • LCSH : Psychological tests -- Congresses