Fault diagnosis of analog integrated circuits

著者

• Kabisatpathy, Prithviraj
• Barua, Alok
• Sinha, Satyabroto

書誌事項

Fault diagnosis of analog integrated circuits

by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha

（Frontiers in electronic testing, 30）

Springer, c2005

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

目次

Fault and Fault Modelling.- Test Stimulus Generation.- Fault Diagnosis Methodology.- Design for Testability and Built-In Self-Test.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA77072609
• ISBN:
  • 038725742X
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Dordrecht
• ページ数/冊数: ix, 182 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7874.654
  • DC22 : 621.3815
• 件名:
  • LCSH : Linear integrated circuits
  • LCSH : Linear integrated circuits -- Testing
• 親書誌ID:
  • BA19587827