IEEE International Workshop on Memory Testing

ID:DA09002934

別名: International Workshop on Memory Testing, IEEE

Workshop on Memory Testing, IEEE International

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Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1996

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2

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council

IEEE Computer Society Press c1995

所蔵館2館
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Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society Press c1994

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