Advances in electronics and electron physics

Author(s)

Bibliographic Information

Advances in electronics and electron physics

edited by L. Marton ; editorial board, T. E. Allibone ... [et al.]

Academic Press, 1954-

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Available at  / 114 libraries

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  • Kansai University Library図

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  • Science and Technology Library, Kyushu University

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  • Kyoto Institute of Technology Library図

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    OPAC

  • Kyoto Sangyo University Library

    v. 6427||A||600078525, v. 7427||A||700000352, v. 8427||A||800000354, v. 9427||A||900000357, v. 10427||A||1000000358, v. 11427||A||1100000355, v. 13427||A||1300067134, v. 14427||A||1400000328, v. 15427||A||1500000327, v. 17427||A||1700000330, v. 18427||A||1800067132, v. 19427||A||1900067133, v. 20427||A||2000078524, v. 21427||A||2100067077, v. 23427||A||2300078523, v. 24427||A||2400076960, v. 59427||ADV||5900356620, v. 68427||ADV||6800600111, v. 81427-ADV+81631955

    OPAC

  • Katsura Library, Kyoto University図

    v. 66ZA||8486016689, v. 68ZA||8786070849, v. 67ZA||8686070852, v. 69ZA||8887082540, v. 70ZA||8988002462, v. 71ZA||9188033553, v. 72ZA||9288086111, v. 62BC||26084019690, v. 41ZA||57||41200033015461, v. 42ZA||57||42200033015470, v. 46ZA||57||46200033015489, v. 47ZA||57||47200033015498, v. 48ZA||57||48200033015506, v. 49ZA||57||49200033015515, v. 51ZA||57||51200033015524, v. 50ZA||57||50200033015533, v. 84M6||2092073914, v. 8549||1||71109072, v. 9549||1||81109073, v. 10549||1||161129957

    OPAC

  • Yukawa Institute for Theoretical Physics, Kyoto University基物研

    v. 6H||ADV||E||61099057F, v. 7H||ADV||E||71099057G, v. 8H||ADV||E||81099057H, v. 9H||ADV||E||91099057, v. 10H||ADV||E||101115583, v. 11H||ADV||E||111139655, v. 13H||ADV||E||131188331, v. 14H||ADV||E||141201797, v. 15H||ADV||E||151221901, v. 17H||ADV||E||171290755, v. 18H||ADV||E||181304496, v. 19H||ADV||E||191338303, v. 20H||ADV||E||201387745, v. 21H||ADV||E||211445093, v. 23H||ADV||E||231554883, v. 24H||ADV||E||241610476, v. 25H||ADV||E||251649483, v. 26H||ADV||E||261672427, v. 27H||ADV||E||271720621, v. 29H||ADV||E||291785802, v. 30H||ADV||E||301848516, v. 31H||ADV||E||311926024, v. 32H||ADV||E||321976429, v. 34H||ADV||E||342009061, v. 35H||ADV||E||352139948, v. 36H||ADV||E||362090033, v. 37H||ADV||E||372139901, v. 38H||ADV||E||382161156, v. 39H||ADV||E||392185731, v. 41H||ADV||E||412260012, v. 42H||ADV||E||422268189, v. 43H||ADV||E||432298804, v. 44H||ADV||E||442390620, v. 45H||ADV||E||452423902, v. 46H||ADV||E||462443222, v. 47H||ADV||E||472494609, v. 48H||ADV||E||482503350, v. 49H||ADV||E||492591461, v. 50H||ADV||E||502620870, v. 51H||ADV||E||512777923, v. 53H||ADV||E||532685610, v. 54H||ADV||E||542709068, v. 55H||ADV||E||552709069, v. 56H||ADV||E||562808512, v. 57H||ADV||E||572812135, v. 58H||ADV||E||582842261, v. 59H||ADV||E||592923641, v. 60H||ADV||E||602932693, v. 61H||ADV||E||612990602, v. 62H||ADV||E||6285065905, v. 63H||ADV||E||6385015856, v. 65H||ADV||E||6585047190, v. 66H||ADV||E||6686031991, v. 67H||ADV||E||6787061071, v. 68H||ADV||E||6887061072, v. 69H||ADV||E||6987085129, v. 70H||ADV||E||7088003462, v. 71H||ADV||E||7188020515, v. 72H||ADV||E||7288089123, v. 75H||ADV||E||7589030020, v. 76H||ADV||E||7689030021, v. 77H||ADV||E||7790062190, v. 78H||ADV||E||7890065070, v. 79H||ADV||E||79200035985779, v. 80H||ADV||E||8092005891, v. 81H||ADV||E||8192005982, v. 82H||ADV||E||8292005983, v. 83H||ADV||E||8393025582, v. 84H||ADV||E||8493025583, v. 85H||ADV||E||8593069213, v. 86H||ADV||E||8693025584, v. 87H||ADV||E||8793069212, v. 88H||ADV||E||8894010117, v. 89H||ADV||E||8994061915

    OPAC

  • 京都大学 工学部南

    v. 23ZA||61546130, v. 24ZA||61603042, v. 26ZA||61665941, v. 27ZA||61714932, v. 35ZA||62053862, v. 36ZA||62085114, v. 39ZA||62211444, v. 58ZA||62829244, v. 60ZA||62927312, v. 56ZA||62791067, v. 57ZA||62772760, v. 10ZA||61101280, v. 8ZA||61040319, v. 25ZA||61634145, v. 59ZA||62896127, v. 63ZA||685010647, v. 65ZA||685054553, v. 53ZA||62665925, v. 54ZA||62665927, v. 14ZA||61189979, v. 15ZA||61215047, v. 20ZA||61443621, v. 31ZA||61912100, v. 32ZA||61956656, v. 29ZA||61762294, v. 30ZA||61829275, v. 34ZA||62014471, v. 37ZA||62141572, v. 38ZA||62167306, v. 11ZA||61146973, v. 13ZA||61174948, v. 43ZA||62306242, v. 44ZA||62388368, v. 45ZA||62419838, v. 55ZA||62710496, v. 6ZA||61025045, v. 7ZA||61025046, v. 9ZA||61071770, v. 17ZA||61273314, v. 18ZA||61300105, v. 21ZA||61450284, v. 61ZA||62987014, v. 19ZA||61443621A

    OPAC

  • Library, Research Institute for Mathematical Sciences, Kyoto University数研

    v. 48C||Advances-13||482740644

    OPAC

  • 京都大学 大学院 情報学研究科

    v. 80549.1||AEP||8091063050, v. 84549.1||AEP||8492062864

    OPAC

  • 京都大学 複合原子力科学研究所 図書室

    v. 18621.38E||A||181344450

    OPAC

  • Kyoto University Library図

    v. 447-3||A||262430147

    OPAC

  • 京都大学 附属図書館 宇治分館エネ研

    v. 201561826859, v. 231551826858, v. 536382673350, v. 567612825579

    OPAC

  • 京都大学 附属図書館 宇治分館化研

    v. 71024124, v. 81045554, v. 91073997, v. 101117415, v. 111141314, v. 141193736, v. 32J85068674, v. 39J2495555, v. 43J2495556, v. 48J2511978, v. 59J2972249, v. 63J85044964, v. 65J85068676, v. 66J86058505, v. 69J88043530, v. 70J88043540, v. 75J89063054, v. 76J89078252, v. 79J91009228, v. 80J91080437, v. 81J91080438

    OPAC

  • 京都大学 附属図書館 宇治分館図

    v. 21549||MAR||21||書庫1448325, v. 23549||MAR||23||書庫1563272

    OPAC

  • 京都大学 理学部化学

    v. 8保存書庫||表面||460200024925434

    OPAC

  • 京都大学 理学部宇宙

    v. 9II-81||MA||91093661

    OPAC

  • 京都大学 理学部物理

    v. 6L||AE||61085018, v. 7L||AE||7c1072814, v. 8L||AE||81063105, v. 9L||AE||91085020, v. 10L||AE||101106373, v. 11L||AE||111137210, v. 13L||AE||131179281, v. 14L||AE||14a1193260, v. 15L||AE||15a1214198, v. 17L||AE||171274558, v. 19L||AE||191337089, v. 20L||AE||201396749, v. 21L||AE||211447424, v. 23L||AE||231554980, v. 24L||AE||241623748, v. 25L||AE||251672712, v. 26L||AE||261687103, v. 27L||AE||271764165, v. 29L||AE||291767559, v. 30L||AE||301849258, v. 31L||AE||311915326, v. 32L||AE||321969503, v. 34L||AE||342043873, v. 35L||AE||352046792, v. 36L||AE||362092514, v. 37L||AE||372124359, v. 38L||AE||382159263, v. 39L||AE||392179174, v. 41L||AE||412256737, v. 42L||AE||422279515, v. 43L||AE||432299312, v. 44L||AE||442430514, v. 45L||AE||452540538, v. 46L||AE||462540539, v. 60L||AE||602938006, v. 61L||AE||613009386, v. 62L||AE||6284019346, v. 63L||AE||6385021281, v. 65L||AE||6585075636, v. 66L||AE||6686019038, v. 67L||AE||6786077118, v. 68L||AE||6886077119, v. 69L||AE||6987116678, v. 70L||AE||7088021962, v. 71L||AE||7188045781, v. 72L||AE||7288085582, v. 80L||AE||8091076433

    OPAC

  • Kindai University Central Library中図

    v. 610023991, v. 810023992, v. 910023993, v. 1010023994, v. 1110023995, v. 1310029087, v. 1410029088, v. 1510029089

    OPAC

  • Gifu University Library

    v. 49549||Adv420589325, v. 58549||Adv120009226

    OPAC

  • Kumamoto University Library工(電気)

    v. 57427/A,16/(57)/57-415191149358

    OPAC

  • 呉工業高等専門学校 図書館図書館

    v. 49549||A-16||4900043882

    OPAC

  • 国立研究開発法人 理化学研究所 図書館

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    OPAC

  • 国立天文台図書室

    v. 6S4:AE:612021482, v. 7S4:AE:712021483, v. 8S4:AE:890000213, v. 9S4:AE:912021484, v. 10S4:AE:1012021485, v. 11S4:AE:1112021486, v. 13S4:AE:1312021488, v. 14S4:AE:1412021489, v. 15S4:AE:1512021490, v. 17S4:AE:1712021492, v. 18S4:AE:1812021493, v. 19S4:AE:1912021494, v. 20S4:AE:2012021495, v. 21S4:AE:2112021496, v. 23S4:AE:2312021499, v. 24S4:AE:2412021500, v. 25S4:AE:2512021501, v. 26S4:AE:2612021502, v. 27S4:AE:2712021503, v. 29S4:AE:2912021506, v. 30S4:AE:3012021507, v. 31S4:AE:3112021508, v. 32S4:AE:3212021509, v. 34S4:AE:3412021512, v. 35S4:AE:3512021513, v. 36S4:AE:3612021514, v. 37S4:AE:3712021515, v. 38S4:AE:3812021516, v. 39S4:AE:3912021517, v. 41S4:AE:4112021520, v. 42S4:AE:4212021521, v. 43S4:AE:4312021522, v. 44S4:AE:4412021523, v. 45S4:AE:4512021524, v. 46S4:AE:4612021525, v. 47S4:AE:4712021526, v. 48S4:AE:4812021527, v. 49S4:AE:4912021528, v. 62S4:AE:629926879, v. 63S4:AE:639926880, v. 65S4:AE:659926883, v. 66S4:AE:669926884, v. 67S4:AE:679926885, v. 68S4:AE:689926886, v. 69S4:AE:699926887, v. 70S4:AE:709926888, v. 71S4:AE:719926889, v. 72S4:AE:729891463, v. 75S4:AE:759891223, v. 76S4:AE:769891186, v. 77S4:AE:779890315, v. 78S4:AE:789890212, v. 79S4:AE:799890973, v. 80S4:AE:809901270, v. 81S4:AE:819901288, v. 82S4:AE:829901302, v. 83S4:AE:839901714, v. 84S4:AE:849911004, v. 85S4:AE:859911315, v. 86S4:AE:869911202, v. 87S4:AE:879911724, v. 88S4:AE:889920119, v. 89S4:AE:899920666

    OPAC

  • Saga University Library図

    v. 35549-A 49-35129901350, v. 37549-A 16-37129901346, v. 41549-A 16-41129901347, v. 42549-A 16-42129901348, v. 43549-A 49-43129901349

    OPAC

  • 山陽小野田市立山口東京理科大学 図書館図

    v. 13549||A 16||1396608244, v. 57549||A 16||5796608245, v. 58549||A 16||5896608246, v. 69549||A 16||6996613095, v. 77549||A 16||7796634358, v. 78549||A 16||7896634359, v. 79549||A 16||7996634360, v. 80549||A 16||8096634361, v. 81549||A 16||8196634362, v. 82549||A 16||8296634363, v. 83549||A 16||8396634364, v. 85549||A 16||8596634365, v. 86549||A 16||8696634366, v. 87549||A 16||8796634367

    OPAC

  • Shizuoka University Library静図

    v. 20549/MA53/201000731024

    OPAC

  • Shizuoka University Library Hamamatsu Branch浜図

    v. 6549.01/6/68700003067, v. 7549.01/6/78100175143, v. 8549.01/6/88700005484, v. 9549.01/6/98700003075, v. 10549.01/6/108700003083, v. 11549.01/6/118100146201, v. 13549.01/6/138100154395, v. 14549.01/6/148100159576, v. 15549.01/6/158100158644, v. 17549.01/6/178100170748, v. 18549.01/6/188100173122, v. 19549.01/6/198700000030, v. 20549.01/6/208700000097, v. 21549.01/6/218700001764, v. 23549.01/6/238100227563, v. 24549.1/1008100242570, v. 25549.01/6/258700008488, v. 26549.01/6/268100248940, v. 27549.01/6/278700009833, v. 29549.01/6/298700011797, v. 30549.01/6/308700011805, v. 31549.01/6/318700013876, v. 32549.01/6/328700013884, v. 34549.01/6/348700015160, v. 35549.01/6/358700015152, v. 36549/MA53/368700015442, v. 37549.01/6/378700015814, v. 38549.01/6/388700016424, v. 39549.01/6/398700021234, v. 41549.01/6/418700023800, v. 42549.01/6/428700024832, v. 43549.01/6/438700027819, v. 44549.01/6/448700028494, v. 45549.01/6/458700032587, v. 46549.01/6/468700032884, v. 47549.01/6/478700033148, v. 48549.01/6/488700033825, v. 49549.01/6/498700038063, v. 50549.01/6/508700040655, v. 51549.01/6/518100410755, v. 53549.01/6/538700041158, v. 54549.01/6/548700041166, v. 55549.01/6/558700041547, v. 56549.01/6/568700044061, v. 57549.01/6/578700044376, v. 58549.01/6/588700044897, v. 59549.01/6/598100455503, v. 60549.01/6/608100455511, v. 61549.01/6/618100455529, v. 62549.01/6/628100455537, v. 63549.01/6/638700052791, v. 65549.01/6/658700054359, v. 66549.01/6/668700055141, v. 67549.01/6/678700056685, v. 68549.01/6/688700056750, v. 69549.01/6/698700058897, v. 70549.01/6/708700059416, v. 71549.01/6/718700059630, v. 75549.01/6/758700063038, v. 76549.01/6/768189040101, v. 77549.01/6/778700063681, v. 78549.01/6/788700065413, v. 79549.01/6/798700065967, v. 80549.01/6/808791068417, v. 81549.01/6/818791068425, v. 82549.01/6/828791068565, v. 83549.01/6/838792069398, v. 84549.01/6/848792070768, v. 85549.01/6/858793000038, v. 86549.01/6/868792071006, v. 88549.01/6/888094000059, v. 89549.01/6/898094021410

    OPAC

  • Shizuoka Institute of Science and Technology

    v. 21T09401937*

    OPAC

  • Shizuoka Institute of Science and Technology

    v. 76T09106516*, v. 81T09200691*, v. 82T09200692*, v. 83T09200693*, v. 84T09200694*

    OPAC

  • Shimane University Library

    v. 6427.15||MA53||61234641

    OPAC

  • 湘南工科大学 附属図書館

    v. 31Z17980, v. 36Z17985, v. 45Z17987, v. 46Z17988, v. 47Z17989, v. 48Z17990, v. 8498013,98014

    OPAC

  • 鈴鹿医療科学大学 附属図書館

    v. 69549||A16||699025365

    OPAC

  • Seikei University Library

    537.5||1||7689202231

    OPAC

  • 摂南大学 図書館本館

    v. 6728715254, v. 6828715255, v. 6928805414, v. 7028808646, v. 7228815099, v. 7528910178, v. 7628910179, v. 7729013335, v. 7829006723, v. 7929010562, v. 8029113131, v. 8129113596, v. 8229113597

    OPAC

  • 崇城大学 図書館

    v. 6549.1||M||61040288, v. 7549.1||M||71040289, v. 8549.1||M||81040290, v. 95549.1||M||91040291, v. 10549.1||M||101040292

    OPAC

  • 拓殖大学 八王子図書館

    v. 8549||8||102T00405591*, v. 13549||13||102T00405593*, v. 31549||31||102T00405594*, v. 36549||36||102T00405595*, v. 45549||45||102T00405598*, v. 46549||46||102T00405599*, v. 47549||47||102T00405600*, v. 48549||48||102T00405601*, v. 49549||49||102T00405602*, v. 51549||51||102T00405603*, v. 57549||57||10200405604, v. 61549||61||10200405605, v. 62549||62||102T00405606*, v. 63549||63||102T00405607*, v. 65549||65||102T00405610*, v. 66549||66||102T00405611*, v. 67549||67||102T00405612*, v. 68549||68||102T00405613*, v. 69549||69||102T00405614*, v. 70549||70||102T00405615*, v. 71549||71||102T00405616*, v. 72549||72||102T00405617*, v. 75549||75||102T00405620*, v. 76549||76||102T00405621*, v. 77549||77||102T00405622*, v. 78549||78||102T00405623*, v. 79549||79||102T00405624*, v. 80549||80||102T0307095*, v. 81549||81||102T0307096*, v. 82549||82||102T0307097*

    OPAC

  • High Energy Accelerator Research Organization図書情報

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    OPAC

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    OPAC

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    v. 291455203

    OPAC

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    v. 73540:A16:737040000312

    OPAC

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    OPAC

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    v. 19427:1505:A,197305026705

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    v. 7549:M7200014566

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Description and Table of Contents

Volume

v. 80 ISBN 9780120146802

Description

This volume contains review articles covering a broad range of topics in image processing and analysis. The topics covered include image analysis - which has united and harmonized a host of heterogeneous material; contemporary approaches to the Fourier transform; number theoretic transforms, which are particularly attractive for discrete, finite signals; the use of the Wigner distribution - which encodes both spatial and spectral information, for image filtering; and applications of the concept of information energy. These up-to-date surveys are intended to provide the reader with access to the latest results in the extremely active field of image science.

Table of Contents

  • Discrete fast Fourier transform algorithms - a tutorial survey, M.An, I.Gertner, M.Rofheart and R.Tolimieri
  • image filtering and analysis through the Wigner distribution, C.Cristobal, C.Gonzalo and J.Bescos
  • number theoretic techniques in digital signal processing, G.A.Jullien
  • information energy and its applications, L.Pardo and I.J.Taneja
  • recent developments in image algebra, G.X.Ritter.
Volume

v. 81 ISBN 9780120146819

Description

This volume combines discussions of the latest research results in the field of charged particle optics with brief biographies of two pioneers of electron microscopy: Bodo von Borries and H.Ruska. This volume also contains subject and author indexes for the entire 81-volume series.
Volume

v. 82 ISBN 9780120146826

Description

This series, covering a range of topics from particle optics to modern electronics, deals, in this volume, with recent advances and developments in electromagnetism, speech coding and bandgap narrowing and its effects on the properties of moderately and heavily doped germanium and silicon.

Table of Contents

  • CAD in electromagnetism
  • speech coding
  • bandgap narrowing and its effects on the properties of moderately and heavily doped germanium and silicon
  • the rectangular patch microstrip radiator solution by singularity adapted moment method
  • some recent advances in multigrid methods.
Volume

v. 83 ISBN 9780120147250

Description

The themes of this volume are all concerned with structures on the microminiaturized scale. The first chapter on vacuum microelectronics is concerned with devices having tolerances in the nanometer range that rely on collision-free motion of electrons in a vacuum. This account of the subject covers emmission from conductors and from semiconductors, the fabricaton and properties of micro-field-emmission sources and the nature of a variety of vacuum micro-electronic devices. The second chapter is also concerned with electron-beam microlithography. Here the emphasis is on system design and the various ways of explaining the interaction between focusing and deflecting fields. The final chapter explains in detail two of the contrast mehanisms that contribute to the image in the most recent generation of low-voltage scanning electron microscopes. All three chapters deal with topics that are at the forefront of current technological development and offer authoritative accounts of subjects in rapid evolution.

Table of Contents

  • Vacuum microelectronics, I. Brodie and C.A. Spindt
  • nanometric-scale electron beam lithography, Z.W. Chen
  • LVSEM for high resolution topographic and density contrast imaging, J.B. Pawley.
Volume

v. 84 ISBN 9780120147267

Description

Despite the many successes of digital processing in domains as far apart as space science, robotics, forensics, and microscopy, many fundamental problems remain unsolved or imperfectly understood. Much of the work described in this volume has not been previously surveyed systematically, therefore, these accounts may form an indispensible addition to the image processing literature. This book sets out to survey systematically image related topics such as vector quantization, lattice transforms, invariant pattern representations, topology, algebra and estimation theory and echographic imaging.
Volume

v. 85 ISBN 9780120147274

Description

The 85th volume in this serial primarily covers electron optics, parallel programming, Cray computers and digital image processing and pattern recognition. Additionally, the text explores a diverse range of optics including the particle optics of accelerators and mass spectrometers.

Table of Contents

  • Recent development in Kalman filtering with applications in navigation, H-J Hotop - the new generation of navigations systems, filter, new Kalman filter formulations, review of the backward Kalman filter theory, application of the Kalman filter in navigations, summary
  • recent advances in 3D display, D.P. Huijsmans and C.J. Jense
  • representation schemes
  • voxel based display methods
  • spatial selection and division
  • hardware support
  • implementations
  • applications of group theory to electron optics, Y. Li
  • m-function and its symmetry group
  • applications to electrostatic multipoles
  • applications to magnetistatic multipoles, a general method for deriving constraint relations
  • parallel programming and cray computers, R.H. Perrott
  • approaches to parallel programming, implicit parallelism, cray computers, parallel computing forum, conclusions. Appendix.
Volume

v. 86 ISBN 9780120147281

Description

This series covers a wide range of topics, stretching from the particle optics of accelerators, mass spectrometers, electron and ion microscopes, and of individual components of these instruments to theoretical and practical aspects of modern electroinics. Another broad intterest is digital image processing and pattern recognition, including the devices employed and the methods developed. Electron physics is interpreted very liberally and articles are often included on materials of current interest as well as on the devices that employ them. The object of the series is to provide articles that may review a new or rapidly developing field, or may cover many years of research, thus providing a small monograph on a specific subject. "Advances in Electronics and Electron Physics" Volume 86 features articles on the following topics: GaAs semiconductor memories; image processing; N-beam calculators; and electron optics.

Table of Contents

  • Recent advances in GaAs dynamic memories, J.A. Cooper
  • expert systems for image processing, analysis and recognition, T. Matsuyama
  • N-beam dynamical calculations, K. Watanabe
  • methods for calculation of parasitic aberrations and machining tolerances in electron optical systems, M.I. Yavor.
Volume

v. 87 ISBN 9780120147298

Description

Chapter 1, Image Restoration on the Hopfield Neural Network, covers image restoration algorithms originally aimed at achieving performance beyond the diffraction limit, but which are in fact capable of compensating simultaneously or separately for aberrations induced by the optical components and for the limitations of the detector. Basic properties of the Hopfield Network are described along with a demonstration of how it provides a framework for interpreting a variety of opt@ation procedures useful in image restoration. The image restoration problem considered is that of improving the resolution of a low pass filtered image or retrieving a high resolution image from limited noisy and/or distorted spectral data. The second chapter, Fundamentals and Special Applications of Non-Contact Scanning Force Microscopy, reviews the basic ftmdamentals and some of the important applications of non-contact mode force microscopy, including a detailed discussion of the various surface forces that may occur between the probe and the sample, an introduction to electronic force microscopy, and a section devoted to the basics of magnetic force microscopy currently the most important application of the force microscope. Some general principles of instrumentation are also discussed. Chapter 3 is Electrical Noise as a Measure of Quality and Reliability in Electronic Devices. Most electronic devices and components produce random electrical signals or noise greater than the well established thermal and shot noise sources. This excess noise depends on the structural defects, impurities, and non-ideal properties of the device. Because noise is a very sensitive indicator of the presence of imperfections in the device, it can be used as a non-destructive measure of the quality, and less directly, the probable lifetime or reliabili ty of the device. An account is given of the particular mechanisms which are well established in individual devices along with a review of the success of the use of noise as a quality or reliability indicator. The final chapter, Parallel Processing Methodologies for Image Processing and Computer Vision, discusses two predominant methodologies in the application of parallel processing technology to image processing and computer vision problems: architecture and application driven methodologies. These represent complementary approaches to the achievement of the same goal: high speed image processing and computer vision. Examples of parallel processing architectures evolved from both methodologies are discussed and compared. General properties of both approaches are presented with a view toward matching specific image processing and computer vision algorithms to appropriate methodologies.

Table of Contents

J.B. Abbiss, M.A. Fiddy and R. Steriti, Image Restoration on the Hopfield Neural Network. U Hartmann, Fundamentals and Special Applications of Non-Contact Scanning Force Microscopy. B.K. Jones, Electrical Noise as a Measure of Quality and Reliability in Electronic Devices. S. Yalamanchili and J.K. Aggarwal, Parallel Processing Methodologies for Image Processing and Computer Vision.
Volume

v. 88 ISBN 9780120147304

Description

This series covers topics ranging from the particle optics of accelerators, mass spectrometers, electron- and ion-microscopes, and their components to theoretical and practical aspects of modern electronics. Also covered is digital image processing and pattern recognition, including the devices employed and the methods developed.

Table of Contents

  • M.R. Dobie and P.H. Lewis, Data Structures for Image Processing in C
  • D.L. Dorset, Electron Crystallography of Organic Molecules
  • P. Maragos, Fractal Signal Analysis Using Mathematical Morphology
  • W.K. Cham, Integer Sinusoidal Transforms
  • S.K. Pal, Fuzzy Set Theoretic Tools for Image Analysis
  • M. Petrou, The Differentiating Filter Approach to Edge Detection.
Volume

v. 89 ISBN 9780120147311

Description

Covers topics ranging from the particle optics of accelerators, mass spectrometers, electron- and ion-microscope and their components to the theoretical and practical aspects of modern electronics. The book also presents discussions on digital image processing and pattern recognition.

Table of Contents

  • Digital techniques in electron off-axis holography, G. Ade
  • optical symbolic substitution architectures, M.S. Alam and M.A. Karim
  • semiconductor quantum devices, M. Cahay and S. Bandyopadhyay
  • fuzzy relations and applications, B. de Baets and E. Kerre
  • basis algorithms in mathematical morphology, R. Jones and I.D. Svalbe
  • mirror-bank energy analyzers, S.P. Karetskaya et al.

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Details

  • NCID
    BA00693567
  • ISBN
    • 0120145278
    • 0120145294
    • 0120145308
    • 0120145316
    • 0120145324
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    • 0120147319
  • LCCN
    49007504
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Orlando ; Boston ; Tokyo
  • Pages/Volumes
    v.
  • Size
    24 cm
  • Classification
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