ID:DA00450856
International Symposium on Defect Recognition and Imaging of Semiconductors Before and After Processing
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edited by A.R. Mickelson
Institute of Physics Pub. c1996 Institute of Physics conference series no. 149
Available at 8 libraries
edited by J. Jiménez
Institute of Physics Pub. 1994 Institute of Physics conference series no. 135
edited by M.R. Brozel, D.J. Stirlnd
Adam Hilger 1992
Available at 6 libraries
edited by T. Ogawa
North-Holland 1990 Journal of crystal growth v. 103, no. 1-4
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edited by Eicke R. Weber
Elsevier 1987 Materials science monographs 44
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edited by J.P. Fillard
Elsevier 1985 Materials science monographs 31
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