Trudy K. Overlin, Kathryn J. Stevens, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

SPIE c1997 Proceedings / SPIE -- the International Society for Optical Engineering v. 2939

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A. Trent DePersia, Suzan Yeager, Steve Ortiz, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

SPIE c1997 Proceedings / SPIE -- the International Society for Optical Engineering v. 2935

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Wade Ishimoto, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

SPIE c1997 Proceedings / SPIE -- the International Society for Optical Engineering v. 2933

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John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

SPIE c1997 Proceedings / SPIE -- the International Society for Optical Engineering v. 2941

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Pierre Pilon, Steve Burmeister, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by, National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

SPIE c1997 Proceedings / SPIE -- the International Society for Optical Engineering v. 2937

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B. Gopalakrishnan ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems

SPIE c1997 Proceedings / SPIE -- the International Society for Optical Engineering v. 3203

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W.L. Wiese, J.R. Fuhr and T.M. Deters

American Chemical Society and American Institute of Physics for National Institute of Standards and Technology c1996 Journal of physical and chemical reference data . Monograph ; no. 7

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Milan Zábranský ...[et al.]

American Chemical Society and American Institute of Physics for National Bureau of Standards c1996 Journal of physical and chemical reference data . Monograph ; no. 6

v. 1 , v. 2

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Wayne Bailey, M. Edward Motamedi, Fang-Chen Luo, chairs/editors ; sponsored by SEMI--Semiconductor Equipment and Materials International, NIST--National Institute of Standards and Technology, SPIE--the International Society for Optical Engineering

SPIE c1995 Proceedings / SPIE -- the International Society for Optical Engineering v. 2641

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editors: Paul Over ... [et al.]

U.S. Dept. of Commerce, Technology Administration, National Instituteof Standards and Technology 1995 NIST special publication 500-229

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