著者
書誌事項
Frontiers in electronic testing
Kluwer Academic Publishers
- タイトル別名
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FRET
この図書・雑誌をさがす
注記
Publisher varies: Springer
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21
- Power-constrained testing of VLSI circuits
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by Nicola Nicolici and Bashir M. Al-Hashimi
Kluwer Academic c2003 Frontiers in electronic testing 22
所蔵館4館
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22
- High performance memory testing : design principles, fault modeling, and self-test
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R. Dean Adams
Kluwer Academic c2003 Frontiers in electronic testing
所蔵館8館
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23
- SOC (System-on-a-Chip) testing for plug and play test automation
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edited by Krishnendu Chakrabarty
Kluwer Academic c2002 Frontiers in electronic testing 21
所蔵館5館
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24
- Test resource partitioning for system-on-a-chip
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[by] Krishnendu Chakrabarty Vikram Iyengar Anshuman Chandra
Kluwer Academic c2002 Frontiers in electronic testing
所蔵館7館
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25
- A designer's guide to built-in self-test
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Charles E. Stroud
Kluwer Academic c2002 Frontiers in electronic testing
: softcover
所蔵館9館
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26
- Boundary-scan interconnect diagnosis
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by José T. De Sousa and Peter Y.K. Cheung
Kluwer Academic Publisher c2001 Frontiers in electronic testing
所蔵館4館
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27
- Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
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Michael L. Bushnell, Vishwani D. Agrawal
Kluwer Academic c2000 Frontiers in electronic testing
所蔵館18館
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28
- Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
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edited by Adam Osseiran
Kluwer Academic Publishers 1999 Frontiers in electronic testing
所蔵館2館
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29
- Research perspectives and case studies in system test and diagnosis
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by John W. Sheppard and William R. Simpson
Kluwer Aacdemic Publishers c1998 Frontiers in electronic testing
所蔵館3館
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30
- Delay fault testing for VLSI circuits
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Angela Krstić, Kwang-Ting (Tim) Cheng
Kluwer Academic Publishers c1998 Frontiers in electronic testing
所蔵館15館
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31
- Formal equivalence checking and design debugging
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by Shi-Yu Huang and Kwang-Ting (Tim) Cheng
Kluwer Academic Publishers c1998 Frontiers in electronic testing
所蔵館9館
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32
- Defect oriented testing for CMOS analog and digital circuits
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by Manoj Sachdev
Kluwer Academic Publishers c1998 Frontiers in electronic testing 10
所蔵館14館
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33
- Introduction to I[ ]D[ ]D[ ]Q[ ] testing
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by Sreejit Chakravarty and Paul J. Thadikaran
Kluwer Academic Publishers c1997 Frontiers in electronic testing
所蔵館7館
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34
- Multi-chip module test strategies
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edited by Yervant Zorian
Kluwer c1997 Frontiers in electronic testing
acid-free paper
所蔵館2館
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35
- Reasoning in Boolean networks : logic synthesis and verification using testing techniques
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by Wolfgang Kunz and Dominik Stoffel
Kluwer Academic c1997 Frontiers in electronic testing v. 9
所蔵館13館
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36
- Testing and testable design of high-density random-access memories
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by Pinaki Mazumder and Kanad Chakraborty
Kluwer Academic 1996 Frontiers in electronic testing
所蔵館4館
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37
- From contamination to defects, faults, and yield loss : simulation and applications
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by Jitendra B. Khare, Wojciech Maly
Kluwer Academic Publishers c1996 Frontiers in electronic testing
所蔵館4館
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38
- Efficient branch and bound search with application to computer-aided design
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by Xinghao Chen and Michael L. Bushnell
Kluwer Academic Publishers c1996 Frontiers in electronic testing
所蔵館8館
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39
- Testability concepts for digital ICs : the macro test approach
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by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
Kluwer Academic Publishers c1995 Frontiers in electronic testing
: hard : alk. paper
所蔵館8館
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40
- Economics of electronic design, manufacture, and test
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edited by Magdy Abadir, Tony Ambler
Kluwer Academic Publishers [c1994] Frontiers in electronic testing
所蔵館1館