ID:DA04967445
同姓同名の著者を検索
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society
IEEE Computer Society c2001
: case
所蔵館1館
editors, Neil Burgess, Luigi Ciminiera ; sponsored by the IEEE Computer Society Technical Committee on VLSI
sponsored by IEEE Computer Society Technical Committee on VLSI ; generous support from SUN Microsystems, Intel Co.
所蔵館5館
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society
Institute of Electrical and Electronics Engieers c2000
:case.
sponsored by IEEE Computer Society Technical Committee on VLSI ... [et al.]
IEEE Computer Society Press c2000
所蔵館3館
Association for Computing Machinery
sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI
IEEE Computer Society Press c1999
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society
Institute of Electrical and Electronics Engieers c1999
sponsored by Esprit Working Group 21949 (ACiD-WG) ... [et al.]
edited by Israel Koren ; sponsored by IEEE Computer Society Technical Committee on VLSI
IEEE Computer Society c1999
所蔵館2館
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
IEEE Computer Society Press c1998
sponsored by IEEE Computer Society, Technical Committee on VLSI ; co-sponsored by University of California, San Diego INTEL Co.
microfiche
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
IEEE Computer Society Press c1997
sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with Association for Computing Machinery (ACM), the American Society for Engineering Education (ASEE) ; support provided by National Science Foundation, Semiconductor Research Corporation
Sponsored by IEEE Computer Society Technical Committee on VLSI ; edited by Lothar Thiele ... [et al.]
: paper
所蔵館4館
edited by Tomas Lang, Jean-Michel Muller, Naofumi Takagi ; sponsored by IEEE Computer Society Technical Committee on VLSI
IEEE Computer Society c1997
sponsored by Eindhoven University of Technology ; in cooperation with IEEE Computer Society, Philips Reserch Laboratories,Eindhoven, Esprit Working Group 21949 (ACid-WG)
sponsored by IEEE Computer Society Technical Committee on VLSI, IEICE Technical Group on VLSI Design, Telecommunications Advancement Foundation ; in cooperation with IFIP WG 10.5, University of Aizu
[s.n.] [1996]
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
IEEE Computer Society Press c1996
Sponsored by IEEE Computer Society Technical Committee on VLSI ; edited by Jose Fortes ... [et al.]