ID:DA1185577X
International Symposium on Defect and Fault Tolerance in VLSI Systems, IEEE
Symposium on Defect and Fault Tolerance in VLSI Systems, IEEE International
DFT
IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
International Workshop on Defect and Fault Tolerance in VLSI Systems
Search authors sharing the same name
edited by Cristiana Bolchini ... [et al.]
IEEE Computer Society c2008
IEEE Computer Society [c2007]
edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)
IEEE Computer Society c2006
edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)
IEEE Computer Society c2005
Available at 1 libraries
[edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)
IEEE Computer Society c2004
Available at 3 libraries
[edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall
IEEE Computer Society c2003
Available at 2 libraries
[sponsored by the IEEE Computer Society Test Technology Technical Council, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]
IEEE Computer Society c2002
sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
IEEE Computer Society c2001
: case
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Torerant Systems, IEICE, Japan
IEEE Computer Society c2000
Available at 5 libraries
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
IEEE Computer Society c1998
: microfiche
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee
