ID:DA1250352X
IEEE Computer Society. Test Technology Technical Committee
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sponsored by IEEE Computer Society Test Technology Technical Council ; Co-Sponsored by National Cheng-Kung University
IEEE Computer Society Press c2000
:case
Available at 1 libraries
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
International Test Conference c2000
: soft , : case , : microfiche
Available at 11 libraries
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society
Institute of Electrical and Electronics Engieers c2000
:case.
sponsored by IEEE Computer Society Test Technology Technical Council
IEEE Computer Society c2000
Available at 3 libraries
sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Shanghai University ... [et al.]
IEEE Computer Society Press c1999
Available at 2 libraries
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society
Institute of Electrical and Electronics Engieers c1999
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
IEEE Computer Society c1998
: microfiche