CiNii Books Author - IEEE Reliability Society

1

Proceedings, 18th IEEE International Symposium on Software Reliability Engineering : ISSRE 2007, Trollhättan, Sweden, 5-9 November 2007

sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Software Engineering (TCSE), IEEE Reliability Society

IEEE Computer Society c2007

Available at 1 libraries
2

2006 IEEE International Reliability Physics Symposium proceedings : 44th annual, San Jose, California, Marchl 26-30, 2006

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers c2006

v. 1 : soft. , v. 2 : soft.

Available at 1 libraries
3

Proceedings, 17th International Symposium on Software Reliability Engineering : ISSRE 2006, November 7-10, 2006, Raleigh, North Carolina

sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Software Engineering (TCSE), IEEE Reliability Society

IEEE Computer Society c2006

Available at 1 libraries
4

2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Electron Devices Society : IEEE Reliability Society c2005

Available at 1 libraries
5

Proceedings, 16th International Symposium on Software Reliability Engineering : ISSRE 2005, 8-11 November 2005, Chicago, Illinois

sponsored by IEEE Computer Society, Rliability Society

IEEE Computer Society c2005

Available at 2 libraries
6

2005 IEEE International Reliability Physics Symposium proceedings : 43nd [i.e. 43rd] annual, San Jose, California, April 17-21, 2005

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers c2005

: soft.

Available at 2 libraries
7

2004 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

The Electron Devices Society and the Reliability Society of the Institute of Electrical and Electronics Engineers c2004

: softbound

Available at 1 libraries
8

ISSRE 2004 proceedings, 15th International Symposium on Software Reliability Engineering : 2-5 November 2004, Saint-Malo, Bretagne, France

sponsored by IEEE Computer Society, Reliability Society, IRISA

IEEE Computer Society c2004

Available at 2 libraries
9

2004 IEEE International Reliability Physics Symposium proceedings : 42nd annual, Phoenix, Arizona, April 25-29, 2004

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2002 c2004

: soft.

Available at 1 libraries
10

2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center c2003

Available at 1 libraries
11

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003

edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore

IEEE Operations Center c2003

Available at 1 libraries
12

Proceedings, 14th International Symposium on Software Reliability Engineering : ISSRE 2003, 17-20 November 2003, Denver, Colorado

sponsored by IEEE Computer Society, IEEE Reliability Society

IEEE Computer Society c2003

Available at 2 libraries
13

2003 IEEE International Reliability Physics Symposium proceedings : 41st annual, Dallas, Texas, March 30-Apri 4, 2003

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers c2002 , c2003

: soft.

Available at 2 libraries
14

2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center c2002

:softbound

Available at 1 libraries
15

Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore

Institute of Electrical and Electronics Engineers c2002

Available at 1 libraries
16

2002 IEEE International Reliability Physics Symposium proceedings : 40th annual, Dallas, Texas, April 7-11, 2002

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2002

: soft.

Available at 2 libraries
17

2001 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center c2001

:softbound

Available at 1 libraries
18

Proceedings : 12th International Symposium on Software Reliability Engineering : ISSRE 2001, 27-30 November, Hong Kong, China

sponsored by IEEE Computer Society, IEEE Reliability Society ; in cooperation with the Chinese University of Hong Kong ... [et al.]

IEEE Computer Society c2001

: case

Available at 2 libraries
19

2001 IEEE International Reliability Physics Symposium proceedings : 39th annual, Orlando, Florida・April 30-May 3, 2001

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2001

: soft.

Available at 1 libraries
20

IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers c2001-

Available at 50 libraries

IEEE Reliability Society

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