ID:DA0261156X
ITC
I.T.C
Test Conference, International
Test Conference
Search authors sharing the same name
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
International Test Conference c1999
: soft , : case , : microfiche
Available at 7 libraries
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
International Test Conference c1998
Available at 8 libraries
International Test Conference c1997
: soft , : case , :microfiche , :CD-ROM
Available at 6 libraries
International Test Conference c1996
Available at 9 libraries
International Test Conference c1995
edited by Paul H. Bardell ... [et al.]
IEEE Computer Society Press c1994
International Test Conference c1994
: soft , : case
Available at 10 libraries
International Test Conference c1993
Available at 11 libraries
[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]
International Test Conference c1992
: soft. , : case. , : micro.
International Test Conference c1991
: library binding , : microfiche , : casebound
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
Tokyo : IEEE Computer Society Press c1990
: paper , : microfiche , : case
Available at 4 libraries
Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
IEEE Computer Society Press , Institute of Electrical and Electronics Engineers, c1989
Available at 5 libraries
sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
Computer Society Press of the IEEE c1988
paper , microfiche , case
sponsored by the IEEE Computer Society, IEEE Philadelphia Section
Computer Society Press of the IEEE , Order from Computer Society of the IEEE c1987
pbk. , microfiche , case
Available at 2 libraries
sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section
IEEE Computer Society Press c1986
pbk. , microfiche , hard
Available at 3 libraries
IEEE Computer Society Press , Order from IEEE Computer Society 1985
pbk. , hard , microfiche
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section
IEEE Computer Society Press c1984
Available at 1 libraries
IEEE Computer Society Press 1983
presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section
IEEE Computer Society Press c1982
sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE
Institute of Electrical and Electronics Engineers , order from IEEE Computer Society c1981
