ID:DA0261156X
ITC
I.T.C
Test Conference, International
Test Conference
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IEEE c2022
Available at 1 libraries
IEEE c2020
IEEE c2019
IEEE c2018
IEEE c2017
IEEE c2016
IEEE c2015
IEEE c2014
IEEE c2013
IEEE c2012
IEEE c2011
IEEE c2010
Available at 2 libraries
Institute of Electrical and Electronics Engineers c2008
Pages 1-534 , Pages 535-1062
Available at 4 libraries
Institute of Electrical and Electronics Engineers c2005
: [set] , v. 1 , v. 2
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
International Test Conference c2004
Available at 5 libraries
International Test Conference c2003 Proceedings : International Test Conference 2003 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
International Test Conference c2003
Available at 6 libraries
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
International Test Conference c2002
International Test Conference c2001
International Test Conference c2000
: soft , : case , : microfiche
Available at 11 libraries