ID:DA02648490
IEEE Philadelphia Section
I.E.E.E. Philadelphia Section
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[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
International Test Conference c2004
Available at 5 libraries
sponsored by IEEE Philadelphia Section, IEEE Aerospace and Electronic Systems Society
IEEE Operations Center c2004
Available at 1 libraries
International Test Conference c2003 Proceedings : International Test Conference 2003 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
Available at 4 libraries
International Test Conference c2003
Available at 6 libraries
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
International Test Conference c2002
International Test Conference c2001
sponsored by IEEE Computer Society Test Technology Technical Council
IEEE Computer Society c2001
: [soft.] , : case.
Co-Sponsored by the IEEE Industry Applications Society Industrial Power Systems Department, the IEEE Florida West Coast Section
IEEE Operations Center c2000
: soft. , : case.
International Test Conference c2000
: soft , : case , : microfiche
Available at 11 libraries
IEEE Operations Center c1999
: soft. , : case. , : micro.
co-sponsored by the IEEE Industry Applications Society, Industrial Power System Department and the IEEE PES/IAS Northern Canada Chapter
IEEE Service Center c1998
sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section
IEEE Computer Society c1998
IEEE Computer Society Press c1997
: pbk
Available at 2 libraries
co-sponsored by the IEEE Industry Applications Society, Industrial and Commercial Power System Department and the Philadelphia, PA IEEE Section
IEEE Service Center c1997
: softbound , : casebound
sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section
IEEE Computer Society Press c1996
IEEE Computer Society Press c1995
pbk.
Available at 3 libraries
IEEE Computer Society Press c1994
sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEE
IEEE Computer Society Press c1993
: soft. , : micro.
sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section
The Society : Institute of Electrical and Electronics Engineers c1992
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
IEEE c1991
