ID:DA1250352X
IEEE Computer Society. Test Technology Technical Committee
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sponsored by IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical Committee
IEEE Computer Society c2008
editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC)
IEEE Computer Society c2007
Available at 1 libraries
[sponsored by IEEE Computer Society Test Technology Technical Council]
Available at 2 libraries
IEEE Computer Society c2006
edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)
sponsored by IEEE Computer Society Test Technology Technical Council
IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University
IEEE Computer Society c2005
Institute of Electrical and Electronics Engineers c2005
: [set] , v. 1 , v. 2
Available at 4 libraries
: pbk
edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)
[sponsored by IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University]
IEEE Computer Society c2004
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
[edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)
Available at 3 libraries
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
International Test Conference c2004
Available at 5 libraries
Available at 6 libraries
sponsored by IEEE Computer Society Technical Council on Test Technology , IEEE Computer Society Technical Committee on Design Automation
IEEE Computer Society c2003