ID:DA08735769
VLSI Test Symposium, IEEE
IEEE Test Symposium--VLSI
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IEEE c2011
Available at 1 libraries
IEEE c2010
IEEE c2009
IEEE Computer Society c2009
IEEE Computer Society c2008
[sponsored by IEEE Computer Society Test Technology Technical Council]
IEEE Computer Society c2007
Available at 2 libraries
sponsored by IEEE Computer Society Test Technology Technical Council
IEEE Computer Society c2006
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)
IEEE Computer Society c2005
IEEE Computer Society c2004
Available at 6 libraries
IEEE Computer Society c2003
Available at 3 libraries
IEEE Computer Society c2002
Available at 4 libraries
IEEE Computer Society c2001
: [soft.] , : case.
Available at 5 libraries
IEEE Computer Society c2000
IEEE Computer Society c1999
sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section
IEEE Computer Society c1998
IEEE Computer Society Press c1997
: pbk
sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section
IEEE Computer Society Press c1996
IEEE Computer Society Press c1995
pbk.
IEEE Computer Society Press c1994
sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEE
IEEE Computer Society Press c1993
: soft. , : micro.