ID:DA1250352X
IEEE Computer Society. Test Technology Technical Committee
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[edited by Magdy S. Abadir and Li-C. Wang] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)
IEEE Computer Society c2003
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edited by C. Metra ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council
IEEE Computer Society 2003
sponsored by Test Technology Technical Council of IEEE Computer Society ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF National Natural Science Foundation of China (NSFC)
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]
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[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
International Test Conference c2003 Proceedings : International Test Conference 2003 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
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International Test Conference c2003
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[edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall
sponsored by IEEE Computer Society Test Technology Technical Council
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editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
IEEE Computer Society c2002
: bookbroker
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
International Test Conference c2002
[sponsored by the IEEE Computer Society Test Technology Technical Council, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]
International Test Conference c2001
sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Technical Group on Fault Tolerant Systems ... [et al.]
IEEE Computer Society c2001
: case
sponsored by IEEE Computer Society Test Technology Technical Council, Tenth Anniversary Committee of Asian Test Symposium
sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society
: [soft.] , : case.
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sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Torerant Systems, IEICE, Japan
IEEE Computer Society c2000