CiNii Books Author - IEEE Computer Society. Test Technology Technical Committee

1

Proceedings, 17th IEEE VLSI Test Symposium : April 25-29, 1999, Dana Point, California

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society c1999

Available at 4 libraries
2

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]

IEEE Computer Society Press c1998

Available at 1 libraries
3

Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society c1998

: microfiche

Available at 1 libraries
4

Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society c1998

Available at 4 libraries
5

Proceedings : International Workshop on Memory Technology, Design, and Testing

edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1997

Available at 1 libraries
6

Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society Press c1997

: pbk

Available at 2 libraries
7

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1996

Available at 1 libraries
8

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council

IEEE Computer Society Press c1995

Available at 2 libraries
9

Proceedings : the sixth IEEE International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, June 7-9 , 1995, Chapel Hill, North Carolina

workshop chair, Nick Kanopoulos, program chair, Rudy Lauwereins, proceedings editor, Rudy Lauwereins ; sponsored by the IEEE Computer Society Technical Committee on Design Automation, the IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press c1995

paper

Available at 6 libraries
10

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society Press c1994

Available at 3 libraries
11

Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

sponsored by the IEEE Computer Society. Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press c1994

: paper , : microfiche

Available at 2 libraries
12

Proceedings: the fifth International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, Grenoble, France, June 21-23, 1994

sponsored by the IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIM

IEEE Computer Society Press c1994

paper , microfiche

Available at 4 libraries
13

Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China

sponsored by the IEEE Computer Society, Test Technology Technical Committee ; in cooperation with China Computer Federation (CCF), Institute of Computing Technology (ICT), CAS, National Natural Science Foundation of China (NSFC)

IEEE Computer Society Press c1993

: paper , : microfiche

Available at 3 libraries
14

Bridging faults and IDDQ testing

[edited] by Y.K. Malaiya and R. Rajsuman

IEEE Computer Society Press 1992 IEEE Computer Society Press technology series

: pbk. , : fiche

Available at 3 libraries
15

Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan

sponsored by IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society Press 1992

: microfiche , : hard

Available at 3 libraries
16

Digest of papers : 1992 IEEE VLSI Test Symposium 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and application, ASICs and systems-on-a-chip

sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section

The Society : Institute of Electrical and Electronics Engineers c1992

Available at 2 libraries
17

Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA

sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

IEEE c1991

: soft. , : micro.

Available at 1 libraries
18

The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC

sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

Tokyo : IEEE Computer Society Press c1990

: paper , : microfiche , : case

Available at 4 libraries
19

ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section

IEEE Computer Society Press , Institute of Electrical and Electronics Engineers, c1989

Available at 5 libraries
20

New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC

sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section

Computer Society Press of the IEEE c1988

paper , microfiche , case

Available at 4 libraries

IEEE Computer Society. Test Technology Technical Committee

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